Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011— 11 стр.
Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics (IEC 60027-2:2005); German version EN 60027-2:2007— 92 стр.