BS ISO 10810:2010

Действует

Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis — 38 стр.

Ссылочные документы

BS ISO 18118:2015

Действует

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — 36 стр.

ISO/TR 18394:2006

Заменен

Surface chemical analysis -- Auger electron spectroscopy -- Derivation of chemical information — 24 стр.

ISO/TR 18392:2005

Действует

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds — 18 стр.

BS ISO 20903:2011

Действует

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results — 24 стр.

BS ISO 16243:2011

Действует

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS) — 20 стр.

BS ISO 19318:2004

Действует

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction — 20 стр.

ISO/TR 22335:2007

Действует

Surface chemical analysis -- Depth profiling -- Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer — 26 стр.

ISO/TR 15969:2001

Действует

Surface chemical analysis. Depth profiling. Measurement of sputtered depth — 20 стр.

BS ISO 18516:2006

Действует

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution — 34 стр.

BS ISO 21270:2004

Действует

Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale — 22 стр.

BS ISO 15472:2010

Действует

Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales — 38 стр.

BS ISO 24237:2005

Действует

Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale — 22 стр.

BS ISO 15470:2017

Действует

Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters — 14 стр.

BS ISO 18117:2009

Заменен

Surface chemical analysis. Handling of specimens prior to analysis — 20 стр.

BS ISO 18116:2005

Заменен

Surface chemical analysis. Guidelines for preparation and mounting of specimens for analysis — 26 стр.

BS ISO 18115-1:2013

Действует

Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy — 114 стр.

ISO/IEC 17025:2017

Действует

General requirements for the competence of testing and calibration laboratories — 38 стр.