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BS ISO 18116:2005

Заменен
Surface chemical analysis. Guidelines for preparation and mounting of specimens for analysis — 26 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

BS ISO 18115-2:2010
Заменен
Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy — 60 стр.
BS ISO 20579-4:2018
Действует
Surface chemical analysis. Guidelines to sample handling, preparation and mounting. Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis — 32 стр.

На этот документ ссылаются

BS EN ISO 14644-10:2013
Действует
Cleanrooms and associated controlled environments. Classification of surface cleanliness by chemical concentration — 38 стр.
BS ISO 16243:2011
Действует
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS) — 20 стр.
BS ISO 16242:2011
Действует
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES) — 22 стр.
18/30368969 DC
Действует
BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer — 26 стр.
BS ISO 10810:2010
Действует
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis — 38 стр.
BS ISO 20579-4:2018
Действует
Surface chemical analysis. Guidelines to sample handling, preparation and mounting. Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis — 32 стр.
BS ISO 18117:2009
Заменен
Surface chemical analysis. Handling of specimens prior to analysis — 20 стр.
18/30364925 DC
Действует
BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis — 36 стр.
BS ISO 29081:2010
Действует
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction — 34 стр.
BS ISO 13424:2013
Действует
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis — 56 стр.
BS ISO 17862:2013
Действует
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers — 34 стр.
BS ISO 16129:2018
Действует
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer — 26 стр.
BS ISO 14701:2018
Действует
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness — 24 стр.
BS ISO 14701:2011
Заменен
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness — 22 стр.
BS ISO 16129:2012
Заменен
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer — 28 стр.
DIN EN ISO 14644-10:2013-06
Отменен
Cleanrooms and associated controlled environments - Part 10: Classification of surface cleanliness by chemical concentration (ISO 14644-10:2013); German version EN ISO 14644-10:2013 — 40 стр.