Uncertainty of measurement -- Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) -- Supplement 1: Propagation of distributions using a Monte Carlo method -- Technical Corrigendum 1— 2 стр.
BS IEC 63068-2. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Part 2. Test method for defects using optical inspection— 26 стр.
