Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials— 14 стр.
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results— 24 стр.
Fine ceramics (advanced ceramics, advanced technical ceramics) -- Determination of specific surface area of ceramic powders by gas adsorption using the BET method— 16 стр.