PD ISO/TR 22335:2007

Действует

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer — 28 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

ISO 5436-1:2000

Действует

Geometrical Product Specifications (GPS). Surface texture: Profile method; Measurement standards. Part 1. Material measures — 19 стр.

BS ISO 18115:2001+A2:2007

Заменен

Surface chemical analysis. Vocabulary — 122 стр.

ASME B46.1-1995

Доступна более новая редакция

Surface Texture, Surface Roughness Waviness and Lay (B46.1 - 1995) — 124 стр.

ISO 12179:2000

Действует

Geometrical Product Specification (GPS). Surfase texture: Profile method. Calibration of contact (stylus) instruments — 24 стр.

ISO 13565-1:1996

Действует

Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surface having stratified functional properties - Part 1: Filtering and general measurement conditions — 12 стр.

ISO 13565-3:1998

Действует

Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 3: Height characterization using the material probability curve — 26 стр.

ISO 14606:2000

Заменен

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials — 20 стр.

ISO/TR 15969:2001

Действует

Surface chemical analysis. Depth profiling. Measurement of sputtered depth — 20 стр.