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DIN 51001 Beiblatt 1:2010-05

Действует
Testing of oxidic raw materials and basic materials - General bases of work for X-Ray fluorescence method (XRF) - General survey on disintegration methods referred to groups of materials for the determination of test specimens for XRF — 9 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 51001:2003-08
Действует
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF) — 6 стр.
DIN EN ISO 12677:2009-07
Отменен
Chemical analysis of refractory products by XRF - Fused cast bead method (ISO/DIS 12677:2009); German version prEN ISO 12677:2009
DIN EN ISO 21068-2:2008-12
Действует
Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon (ISO 21068-2:2008); German version EN ISO 21068-2:2008 — 60 стр.
DIN 51001 Beiblatt 1:2003-08
Отменен
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF) - General survey on disintegration methods referred to groups of materials for the determination of test specimens for XRF — 7 стр.

На этот документ ссылаются

DIN 51418-2:2015-03
Действует
X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results — 46 стр.
DIN 51001 Beiblatt 1:2003-08
Отменен
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF) - General survey on disintegration methods referred to groups of materials for the determination of test specimens for XRF — 7 стр.