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DIN EN 62276:2006-04

Отменен
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005 — 38 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN IEC 61019-1-2:1994-01
Отменен
Surface acoustic wave (SAW) resonators; part 1: general information, standard values and test conditions; section 2: test conditions; identical with IEC 61019-1-2:1993
DIN IEC 61019-3:1993-09
Действует
Surface acoustic wave (SAW) resonators; part 3: standard outlines and lead connections; identical with IEC 61019-3:1991
DIN EN ISO 4287/A2:2013-04
Отменен
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters - AMENDMENT 2: Parameters Xsm and Xc (ISO 4287:1997/DAM 2:2013); German version EN ISO 4287:1997/prA2:2013
ASTM F1544-11
Заменен
Standard Specification for Determining the Rating Velocities of a Compound Archery Bow — 2 стр.
ASTM F533-96
Заменен
Standard Test Method for Thickness and Thickness Variation of Silicon Wafers — 4 стр.
ASTM F657-92(1999)
Отменен
Standard Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning (Withdrawn 2003) — 10 стр.
DIN IEC 60758:1994-02
Отменен
Synthetic quartz crystal; specification and guide to the use; identical with IEC 60758:1993
DIN IEC 60862-1:1992-08
Отменен
Surface acoustic wave (SAW) filters; part 1: general information, standard values and test conditions; chapter I: general information and standard values; chapter II: test conditions; identical with IEC 60862-1:1989
DIN IEC 60862-2:2009-05
Отменен
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide to the use (IEC 49/844/CD:2009)
DIN IEC 60862-3:1992-05
Отменен
Surface acoustic wave (SAW) filters; part 3: standard outlines (chapter IV); identical with IEC 60862-3:1986
DIN EN 62276:2013-08
Отменен
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013 — 43 стр.
DIN IEC 62276:2009-10
Отменен
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/879/CD:2009)

На этот документ ссылаются

DIN EN 62276:2013-08
Отменен
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013 — 43 стр.