DIN 51003:2004-05

Отменен

Total reflection x-ray fluorescence - Principles and definitions — 44 стр.

Ссылочные документы

DIN 5031-8:1982-03

Действует

Physics of radiation in the field of optics and illuminating engineering; definitions and constants of radiation physics — 4 стр.

DIN 32633:1998-12

Отменен

Chemical analysis - Methods of Standard addition - Procedure, evaluation — 7 стр.

DIN 51009:2001-12

Отменен

Optical atomic spectral analysis - Principles and definitions — 41 стр.

DIN 51418-1:1996-09

Отменен

X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles — 24 стр.

DIN 51003:2022-05

Действует

Total reflection X-ray fluorescence - Principles and definitions

На этот документ ссылаются

DIN 51418-2:2015-03

Действует

X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results — 46 стр.

PD ISO/TS 18507:2015

Действует

Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis — 42 стр.