Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists— 4 стр.
X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results— 16 стр.
X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results— 46 стр.
Optical radiation physics and illumination Engineering - Supplement 1: Index of quantities, symbols and units; and subject index to DIN 5031 part 1 to part 11— 24 стр.
Optical radiation physics and illuminating engineering - Part 11: Radiometer for measuring actinic radiant quantities - Terms, characteristics and their classification— 68 стр.