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СтандартыDIN

DIN EN 190100:1995-02

Действует
Sectional specification: Digital monolithic integrated circuits; German version EN 190100:1993 — 56 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 40900-12:1992-09
Отменен
Graphical symbols for diagrams; binary logic elements, IEC 60617-12:1991, modified — 210 стр.
DIN 41785-3:1975-02
Отменен
Semiconductor devices; letter symbols for data sheets for power semiconductor devices — 4 стр.
DIN 41791-4:1974-03
Отменен
Semiconductor devices for telecommunication; recommendations for data sheets, low-power signal transistors — 3 стр.
DIN 41791-6:1976-06
Отменен
Semiconductor devices for telecommunication; recommendations for data sheets, switching transistors — 4 стр.
DIN IEC 60068-2-30:1986-09
Отменен
Electrical engineering; basic environmental testing procedures; test Db and guidance: damp heat, cyclic (12 + 12-hour cycle); identical with IEC 60068-2-30, edition 1980 (status as of 1985)
DIN IEC 60747-1:1987-03
Отменен
Semiconductor devices; discrete devices and integrated circuits; general; identical with IEC 60747-1, edition 1983
DIN IEC 60747-10:1987-10
Отменен
Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DIN IEC 60748-1:1988-01
Отменен
Semiconductor devices; integrated circuits; part 1: general; identical with IEC 60748-1, edition 1984
DIN IEC 60748-2:1990-11
Отменен
Semiconductor devices; integrate circuits; part 2: digital integrated circuits; identical with IEC 60748-2:1985
DIN 45940-1*CECC 90000:1984-11
Отменен
Harmonized system of quality assessment for electronic components; monolithic integrated circuits
DIN IEC 60147-1E:1980-04
Отменен
Fifth supplement to publication 147-1 (1972): essential ratings and characteristics of semiconductor devices and general principles of measurement methods; part 1: essential ratings and characteristics
DIN IEC 60747-2:2001-02
Действует
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
DIN IEC 60747-11:1992-04
Действует
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN IEC 60748-3-1:1994-01
Отменен
Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section one: blank detail specification for monolithic integrated operational amplifiers; identical with IEC 60748-3-1:1991
DIN 45940-1132*CECC 90112:1989-02
Отменен
Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/wirte dynamic memories silicon monolithic circuits