DIN 41792 Beiblatt 1:1971-09

Отменен

Semiconductor devices for telecommunication; measuring methods, transistors — 14 стр.

Ссылочные документы

Отменен

Low power semiconductor devices; measuring methods; field effect transistors — 6 стр.

Отменен

Semiconductor discrete devices and integrated circuits - Part 7: Bipolar transistors (IEC 60747-7:1988 + A1:1988 + A2:1994)

Отменен

Low power semiconductor devices; measuring methods; field effect transistors — 6 стр.