Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals in bars by means of the two-point-probe direct current method— 4 стр.
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array— 5 стр.
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array— 5 стр.
