Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008); German version EN 60689:2009— 20 стр.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997— 9 стр.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency f<(Index)L>, load resonance resistance R<(Index)L> and the calculation of other derived values of quartz crystal units, up to 30 MHz (IEC 60444-4:1988); German version EN 60444-4:1997— 11 стр.
Quartz crystal units; method for the measurement of resonance frequency and equivalent series resistance by zero phase technique in a <pi>-network— 8 стр.
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003— 12 стр.
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017— 17 стр.
