Стандарты DIN

DIN 41792-6:1981-05

Отменен

Low power semiconductor devices; measuring methods; field effect transistors — 6 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

DIN 41791-9:1974-04

Отменен

Low power semiconductor devices; recommendations for data sheets, field-effect transistors — 8 стр.

DIN 41792-6:1981-05

Отменен

Low power semiconductor devices; measuring methods; field effect transistors — 6 стр.

DIN 41792 Beiblatt 1:1971-09

Отменен

Semiconductor devices for telecommunication; measuring methods, transistors — 14 стр.

DIN IEC 60747-8:1989-08

Отменен

Semiconductor devices - Discrete devices - Field-effect transistors; Identical with IEC 60747-8:1984

На этот документ ссылаются

DIN 41792 Beiblatt 4:1972-10

Отменен

Low power semiconductor devices; measuring methods, voltage reference and regulator diodes — 3 стр.

DIN 41792 Beiblatt 2:1967-06

Отменен

Semiconductor devices for telecommunication; measuring methods, diodes — 4 стр.

DIN 41793-1:1971-05

Отменен

Low power semiconductor devices; reference measuring conditions, general — 2 стр.

DIN 41792-6:1981-05

Отменен

Low power semiconductor devices; measuring methods; field effect transistors — 6 стр.

DIN 41793-2:1974-03

Отменен

Low pover semiconductor devices; electrical reference measuring methods, transistors — 5 стр.

DIN 41792 Beiblatt 1:1971-09

Отменен

Semiconductor devices for telecommunication; measuring methods, transistors — 14 стр.

DIN 44480-64:1984-03

Отменен

Electrical measuring methods for integrated circuits; supply voltage rejection ratio to a change of all supply voltages simultaneously — 2 стр.

DIN 44480-16:1977-12

Отменен

Electrical measuring methods for integrated circuits; output pulse duration t<(Index)Q> — 2 стр.

DIN 44480-1:1980-04

Отменен

Measuring methods for integrated circuits; survey — 6 стр.

DIN 44480-4:1977-03

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)s> under dynamic conditions — 2 стр.

DIN 44480-8:1977-03

Отменен

Electrical measuring methods for integrated circuits; equivalent input- and output-capacitance and/or equivalent input- and output resistance — 3 стр.

DIN 44480-49:1983-05

Отменен

Electrical measuring methods for integrated circuits; supply voltage rejection ratio — 2 стр.

DIN 44480-28:1980-05

Отменен

Electrical measuring methods for integrad circuits; output noise voltage U<(Index)n> — 2 стр.

DIN 44480-10:1981-05

Отменен

Electrical measuring methods for integrated circuits; short-circuit output current I<(Index)QS> — 2 стр.

DIN 44480-19:1977-03

Отменен

Electrical measuring methods for integrated circuits; recovery time t<(Index)rec> — 2 стр.

DIN 44480-3:1980-05

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)S>, static — 2 стр.

DIN 44480-6:1980-05

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)I>, static — 2 стр.

DIN 44480-30:1980-05

Отменен

Electrical measuring methods for integrated circuits; quiescent current I<(Index)IQ> — 2 стр.

DIN 44480-33:1980-05

Отменен

Electrical measuring methods for integrated circuits; transient response to changes of input voltage — 2 стр.

DIN 44480-26:1980-05

Отменен

Electrical measuring methods for integrated circuits; ripple rejection ratio k<(Index)RR>, input stabilization coefficient k<(Index)SIV> — 2 стр.

DIN 44480-11:1981-05

Отменен

Electrical measuring methods for integrated circuits; output voltages V<(Index)OH> and V<(Index)OL> — 2 стр.

DIN 44480-13:1981-05

Отменен

Electrical measuring methods for integrated circuits; propagation times t<(Index)PLH> and t<(Index)PHL> — 2 стр.

DIN 44480-31:1980-05

Отменен

Electrical measuring methods for integrated circuits; short-circuit output current I<(Index)OS> — 2 стр.

DIN 44480-46:1983-05

Отменен

Electrical measuring methods for integrated circuits; output impedance z<(Index)0> — 2 стр.

DIN 44480-25:1980-05

Отменен

Electrical measuring methods for integrated circuits; input stabilization coefficient k<(Index)SIV> — 2 стр.

DIN 44480-15:1981-05

Отменен

Electrical measuring methods for integrated circuits; set-up time t<(Index)su> — 2 стр.

DIN 44480-14:1981-05

Отменен

Electrical measuring methods for integrated circuits; transition time t<(Index)T> and delay time t<(Index)D> — 2 стр.

DIN 44480-27:1980-05

Отменен

Electrical measuring methods for integrad circuits; load stabilization coefficient k<(Index)SOV> — 2 стр.

DIN 44480-5:1977-03

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)s> supplied through the clockline — 2 стр.

DIN 44480-29:1980-05

Отменен

Electrical measuring methods for integrated circuits; temperatur coefficient of regulated output voltage <alpha><(Index)UO> — 2 стр.