Стандарты DIN

DIN IEC 60748-3:1993-07

Отменен

Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; identical with IEC 60748-3:1986

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DIN EN 190000:1996-05

Действует

Generic specification: Monolithic integrated circuits; German version EN 190000:1995 — 267 стр.

DIN 41860:1973-01

Отменен

Linear integrated amplifier circuits; types of amplifiers and terminology — 12 стр.

DIN 41792:1965-08

Отменен

Semiconductor devices for telecommunication; general principles of measuring methods, precautions — 1 стр.

DIN 41785-5:1972-09

Отменен

Semiconductor devices and integrated microcircuits; letter symbols for linear integrated amplifiers — 3 стр.

DIN 44480-49:1983-05

Отменен

Electrical measuring methods for integrated circuits; supply voltage rejection ratio — 2 стр.

DIN 44480-28:1980-05

Отменен

Electrical measuring methods for integrad circuits; output noise voltage U<(Index)n> — 2 стр.

DIN 44480-44:1983-05

Отменен

Electrical measuring methods for integrated circuits; common-mode rejection ratio k<(Index)CMR> (for operational amplifiers) — 2 стр.

DIN 44480-39:1982-03

Отменен

Measuring methods for integrated circuits; input offset current <JOTA><(Index)IO>, temperature coefficient <alpha><(Index)IIO> of the input offset current — 2 стр.

DIN 44480-34:1981-05

Отменен

Electrical measuring methods for integrated circuits; transient response to changes of load current — 2 стр.

DIN 44480-43:1983-05

Отменен

Electrical measuring methods for integrated circuits; common-mode rejection ratio k<(Index)CMR>, common-mode input voltage U<(Index)IC> (for operational amplifiers) — 3 стр.

DIN 44480-30:1980-05

Отменен

Electrical measuring methods for integrated circuits; quiescent current I<(Index)IQ> — 2 стр.

DIN 44480-33:1980-05

Отменен

Electrical measuring methods for integrated circuits; transient response to changes of input voltage — 2 стр.

DIN 44480-48:1983-05

Отменен

Electrical measuring methods for integrated circuits; input offset voltage U<(Index)IO> and temperature coefficient a<(Index)UIO> for operational amplifier — 2 стр.

DIN 44480-26:1980-05

Отменен

Electrical measuring methods for integrated circuits; ripple rejection ratio k<(Index)RR>, input stabilization coefficient k<(Index)SIV> — 2 стр.

DIN 44480-31:1980-05

Отменен

Electrical measuring methods for integrated circuits; short-circuit output current I<(Index)OS> — 2 стр.

DIN 44480-46:1983-05

Отменен

Electrical measuring methods for integrated circuits; output impedance z<(Index)0> — 2 стр.

DIN 44480-25:1980-05

Отменен

Electrical measuring methods for integrated circuits; input stabilization coefficient k<(Index)SIV> — 2 стр.

DIN 44480-47:1983-05

Отменен

Electrical measuring methods for integrated circuits; input offset voltage U<(Index)IO> and temperature coefficient a<(Index)UIO> for operational amplifier — 2 стр.

DIN 44480-27:1980-05

Отменен

Electrical measuring methods for integrad circuits; load stabilization coefficient k<(Index)SOV> — 2 стр.

DIN 44480-29:1980-05

Отменен

Electrical measuring methods for integrated circuits; temperatur coefficient of regulated output voltage <alpha><(Index)UO> — 2 стр.