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СтандартыDIN

DIN EN 62341-1-1:2010-05

Действует
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications (IEC 62341-1-1:2009); German version EN 62341-1-1:2009 — 24 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN IEC 62341-5:2007-08
Отменен
Organic Light Emitting Diode Displays - Part 5: Environmental test methods (IEC 110/109/CD:2007)
DIN ISO 2859-10:2009-12
Отменен
Sampling procedures for inspection by attributes - Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes (ISO 2859-10:2006); Text in German and English — 31 стр.
DIN ISO 2859-2:1993-04
Действует
Sampling procedures for inspection by attributes; sampling plans indexed by limiting quality (LQ) for isolated lot inspection; identical with ISO 2859-2:1985 — 24 стр.
DIN ISO 2859-3:2007-10
Действует
Sampling procedures for inspection by attributes - Part 3: Skip-lot sampling procedures (ISO 2859-3:2005); Text in German, English — 71 стр.
DIN ISO 2859-4:2005-09
Отменен
Sampling procedures for inspection by attributes - Part 4: Procedures for assessment of declared quality levels (ISO 2859-4:2002) — 39 стр.
DIN IEC QC 001002-2:1997-02
Отменен
Rules of procedure of the IEC Quality Assessment System for electronic components (IECQ) - Part 2: Documentation; technology Approval Schedules (IEC QC 001002-2:1995)
DIN IEC QC 001002-3:1997-02
Отменен
Rules of procedure for the IEC Quality Assessment System for electronic components (IECQ) - Part 3: Approval procedures; technology Approval (IEC QC 001002-3:1995)
DIN IEC 60747-1/A1:2009-08
Отменен
Semiconductor devices - Part 1: General (IEC 47/2015A/CDV:2009)