Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003— 12 стр.
Piezoelectric devices - Preparation of outline drawings of surface mounted devices (SMD) for frequency control and selection - General rules (IEC 49/894/CD:2009)
Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction— 100 стр.
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 4: method for the measurement of load resonance frequency f<(Index)L>, load resonance resistance R<(Index)L> and the calculation of other derived values of quartz crystal units, up to 30 MHz; identical with IEC 60444-4:1988
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
Measurement of Quartz Crystal Unit Parameters - Part 11: Standard Method for the determination of the load resonance frequency f<(Index)L> and the effective load capacitance C<(Index)Leff> using automatic network analyzer techniques and error correction (IEC 49/806/CD:2008)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016); German version EN 61240:2017)— 20 стр.
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction (IEC 60444-5:1995); German version EN 60444-5:1997— 38 стр.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997— 9 стр.
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (IEC 60444-11:2010) (english version)
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017— 17 стр.
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017— 17 стр.
