Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003— 7 стр.
Environmental testing - Part 2: Tests; guidance on the application of the tests of IEC 60068 to simulate the effects of storage (IEC 60068-2-48:1982); German version EN 60068-2-48:1999— 6 стр.
Basic environmental testing procedures; part 2: tests; guidance on the application of the tests of IEC Publication 60068 to simulate the effects of storage
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017— 9 стр.
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001— 74 стр.
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001— 74 стр.
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017— 9 стр.
