Rules of procedure of the IEC Quality Assessment System for electronic components (IECQ) - Part 2: Documentation; technology Approval Schedules (IEC QC 001002-2:1995)
Rules of procedure for the IEC Quality Assessment System for electronic components (IECQ) - Part 3: Approval procedures; technology Approval (IEC QC 001002-3:1995)
Electrical engineering; basis environmental testing procedures; test Fc and guidance: vibration (sinusoidal); identical with IEC 60068-2-6:1982 (status as of 1985)
Electrical engineering; basic environmental testing procedures; test Ga and guidance: acceleration, staedy state; identical with IEC 60068-2-7:1983 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test N: change of temperature; identical with IEC 60068-2-14, edition 1984 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test U: robustness of terminations and integral mounting devices; identical with IEC 60068-2-21, edition 1983
Electrical engineering; basic environmental testing procedures; test Db and guidance: damp heat, cyclic (12 + 12-hour cycle); identical with IEC 60068-2-30, edition 1980 (status as of 1985)
Electrical engineering; environmental testing; test Td: solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD); identical with IEC 60068-2-58:1989
Measurement of Quartz Crystal Unit Parameters - Part 11: Standard Method for the determination of the load resonance frequency f<(Index)L> and the effective load capacitance C<(Index)Leff> using automatic network analyzer techniques and error correction (IEC 49/806/CD:2008)
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 4: method for the measurement of load resonance frequency f<(Index)L>, load resonance resistance R<(Index)L> and the calculation of other derived values of quartz crystal units, up to 30 MHz; identical with IEC 60444-4:1988
Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction— 100 стр.
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; section 1: Blank detail specification; identical with IEC 61178-2-1:1993
A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 3: Sectional specification, qualification approval; identical with IEC 61178-3:1993
