Стандарт DIN IEC 60748-2:1990-11

DIN EN 60747-16-1:2002-07

Отменен

Semiconductor devices - Part 16-1: Microwave integrated circuits; Amplifiers (IEC 60747-16-1:2001); German version EN 60747-16-1:2002 — 47 стр.

DIN EN 60749-34:2011-05

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010); German version EN 60749-34:2010 — 12 стр.

DIN EN 60027-2:2007-11

Действует

Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics (IEC 60027-2:2005); German version EN 60027-2:2007 — 92 стр.

DIN EN 60679-1:2004-03

Отменен

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:1997 + A1:2002 + A2:2003); German version EN 60679-1:1998 + A1:2002 + A2:2003 — 90 стр.

DIN EN 60747-16-3:2003-02

Отменен

Semiconductor devices - Part 16-3: Microwave integrated circuits; Frequency converters (IEC 60747-16-3:2002); German version EN 60747-16-3:2002 — 44 стр.

DIN EN 61964:2000-01

Действует

Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999 — 14 стр.

DIN EN 60747-16-4:2005-03

Отменен

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004); German version EN 60747-16-4:2004 — 30 стр.

DIN EN 60679-1:2002-10

Отменен

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:1997 + A1:2002); German version EN 60679-1:1998 + A1:2002 — 80 стр.

DIN EN 61747-10-1:2014-06

Действует

Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical (IEC 61747-10-1:2013); German version EN 61747-10-1:2013 — 14 стр.

DIN EN 190000:1996-05

Действует

Generic specification: Monolithic integrated circuits; German version EN 190000:1995 — 267 стр.

DIN EN 190100:1995-02

Действует

Sectional specification: Digital monolithic integrated circuits; German version EN 190100:1993 — 56 стр.

DIN 41792:1965-08

Отменен

Semiconductor devices for telecommunication; general principles of measuring methods, precautions — 1 стр.

DIN 41859-1:1973-12

Отменен

Electrical digital circuits; terms and definitions — 9 стр.

DIN 41859-2:1973-12

Отменен

Electrical digital circuits; designation of sequential circuits and description of their functions — 12 стр.

DIN 44480-1:1980-04

Отменен

Measuring methods for integrated circuits; survey — 6 стр.

DIN 44480-4:1977-03

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)s> under dynamic conditions — 2 стр.

DIN 44476-3:1982-01

Отменен

Semiconductor devices and integrated circuits; integrated circuit memories; terms for static read/write memories — 6 стр.

DIN 44480-24:1981-02

Отменен

Electrical measuring methods for integrated circuits; hysteresis voltage U<(Index)hys> and input threshold voltage U<(Index)IT> — 2 стр.

DIN 44480-2:1980-05

Отменен

Electrical measuring methods for integrated circuits; holdtime t<(Index)h> — 2 стр.

DIN 44480-8:1977-03

Отменен

Electrical measuring methods for integrated circuits; equivalent input- and output-capacitance and/or equivalent input- and output resistance — 3 стр.

DIN 44476-1:1982-01

Отменен

Semiconductor devices and integrated circuits; integrated circuit memories; types of memories — 3 стр.

DIN 44480-10:1981-05

Отменен

Electrical measuring methods for integrated circuits; short-circuit output current I<(Index)QS> — 2 стр.

DIN 44480-3:1980-05

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)S>, static — 2 стр.

DIN 44480-6:1980-05

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)I>, static — 2 стр.

DIN 44480-13:1981-05

Отменен

Electrical measuring methods for integrated circuits; propagation times t<(Index)PLH> and t<(Index)PHL> — 2 стр.

DIN 44476-2:1982-01

Отменен

Semiconductor devices and integrated circuits; integrated circuit memories; general terms — 6 стр.

DIN 44480-18:1981-02

Отменен

Electrical measuring methods for integrated circuits; maximum switching frequency (f<(Index)p max>) — 2 стр.

DIN 44480-15:1981-05

Отменен

Electrical measuring methods for integrated circuits; set-up time t<(Index)su> — 2 стр.

DIN 44480-14:1981-05

Отменен

Electrical measuring methods for integrated circuits; transition time t<(Index)T> and delay time t<(Index)D> — 2 стр.

DIN 44480-17:1981-01

Отменен

Electrical measuring methods for integrated circuits; resolution time t<(Index)res> — 2 стр.

DIN 44480-5:1977-03

Отменен

Electrical measuring methods for integrated circuits; supply current I<(Index)s> supplied through the clockline — 2 стр.

DIN EN 60747-16-1:2017-10

Действует

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 - A1:2007 - A2:2017); German version EN 60747-16-1:2002 + A1:2007 + A2:2017 — 63 стр.

DIN EN 60747-16-1:2007-10

Отменен

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007 — 58 стр.

DIN EN 60747-16-4:2011-08

Отменен

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009); German version EN 60747-16-4:2004 + A1:2011 — 30 стр.

DIN EN 60747-16-3:2009-11

Отменен

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009); German version EN 60747-16-3:2002 + A1:2009 — 46 стр.

DIN EN 62884-1:2018-02

Действует

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017 — 66 стр.

DIN EN 61360-1:2018-07

Действует

Standard data element types with associated classification scheme - Part 1: Definitions - Principles and methods (IEC 61360-1:2017); German version EN 61360-1:2017 — 181 стр.

Каталог стандартов

DIN IEC 60748-2:1990-11

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