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СтандартыDIN

DIN EN 60749-34:2011-05

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010); German version EN 60749-34:2010 — 12 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN IEC 60747-1/A1:2009-08
Отменен
Semiconductor devices - Part 1: General (IEC 47/2015A/CDV:2009)
BS IEC 60747-4-2:2000
Действует
Semiconductor devices. Discrete devices. Microwave diodes and transistors. Integrated-circuit microwave amplifiers. Blank detail specification — 22 стр.
BS IEC 60747-5-4:2006
Действует
Semiconductor devices. Discrete devices. Optoelectronic devices. Semiconductor lasers — 32 стр.
DIN IEC 60747-6-2:1992-05
Отменен
Semiconductor devices - Part 6: Thyristors; Section two: Blank detail specification for bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A; Identical with IEC 60747-6-2:1991
DIN IEC 60747-7:1997-12
Отменен
Semiconductor discrete devices and integrated circuits - Part 7: Bipolar transistors (IEC 60747-7:1988 + A1:1988 + A2:1994)
DIN IEC 60747-8-1:1991-07
Отменен
Semiconductor devices - Field-effect transistors; Section one: Blank detail specification for single-gate field-effect tramsistors up to 5 W and 1 GHz; Identical with IEC 60747-8-1:1987
BS IEC 60747-8-4:2004
Действует
Discrete semiconductor devices. Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications — 64 стр.
BS IEC 60747-9:2007
Действует
Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs) — 60 стр.
DIN IEC 60747-10:1987-10
Отменен
Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DIN IEC 60747-11:1992-04
Действует
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
BS IEC 60747-14-1:2000
Заменен
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors, General and classification, Sensor generals and classification for semiconductor sensors — 14 стр.
BS IEC 60747-14-2:2000
Действует
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements — 18 стр.
BS IEC 60747-14-3:2009
Действует
Semiconductor devices. Semiconductor sensors. Pressure sensors — 22 стр.
BS IEC 60747-14-4:2011
Действует
Semiconductor devices. Discrete devices. Semiconductor accelerometers — 102 стр.
BS IEC 60747-14-5:2010
Действует
Semiconductor devices. Semiconductor sensors. PN-junction semiconductor temperature sensor — 20 стр.
BS IEC 60747-16-2:2001
Действует
Semiconductor devices, Microwave integrated circuits. Frequency prescalers — 34 стр.
DIN IEC 60747-16-3/A1:2007-10
Отменен
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 47E/335/CD:2007)
DIN IEC 60747-2:2001-02
Действует
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
DIN IEC 60748-1:1988-01
Отменен
Semiconductor devices; integrated circuits; part 1: general; identical with IEC 60748-1, edition 1984
DIN IEC 60748-2:1990-11
Отменен
Semiconductor devices; integrate circuits; part 2: digital integrated circuits; identical with IEC 60748-2:1985
BS IEC 60748-2-11:1999
Действует
Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory — 22 стр.
BS IEC 60748-2-20:2008
Действует
Semiconductor devices. Integrated circuits. Digital integrated circuits. Family specification. Low voltage integrated circuits — 22 стр.
BS IEC 60748-2-12:2001
Действует
Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for programmable logic devices (PLDs) — 30 стр.
DIN IEC 60748-3-1:1994-01
Отменен
Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section one: blank detail specification for monolithic integrated operational amplifiers; identical with IEC 60748-3-1:1991
DIN IEC 60747-3-2:1992-04
Отменен
Semiconductor devices - Part 3: Signal diodes and regulator diodes; Section two: Blank detail specification for voltage-regulator diodes and voltage reference diodes; Identical with IEC 60747-3-2:1986
BS IEC 60748-4:1997
Действует
Semiconductor devices. Integrated circuits, Interface integrated circuits — 146 стр.
BS IEC 60748-4-3:2006
Действует
Semiconductor devices. Integrated circuits. Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC) — 38 стр.
BS IEC 60748-5:1997
Действует
Semiconductor devices. Integrated circuits, Semicustom integrated circuits — 26 стр.
BS IEC 60748-11:2000
Действует
Semiconductor devices. Integrated circuits, Sectional specification for semiconductor integrated circuits excluding hybrid circuits — 30 стр.
DIN IEC 60748-20:1990-10
Отменен
Semiconductor devices; integrated circuits; part 20: generic specification for film integrated circuits and hybrid film integrated circuits; identical with IEC 60748-20:1988
BS IEC 60748-23-1:2002
Действует
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Generic specification — 88 стр.
BS IEC 60748-23-2:2002
Действует
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification, Internal visual inspection and special tests — 100 стр.
BS IEC 60748-23-3:2002
Действует
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Manufacturers' self-audit checklist and report — 88 стр.
BS IEC 60748-23-4:2002
Действует
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Blank detail specification — 22 стр.
BS IEC 60748-23-5:2003
Действует
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification. Procedure for qualification approval — 32 стр.
DIN EN 60749-34:2004-10
Отменен
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004 — 11 стр.

На этот документ ссылаются

DIN EN 60749-34:2004-10
Отменен
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004 — 11 стр.