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DIN 50431:1980-09

Отменен
Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array — 5 стр.
DIN 50431:1988-05
Отменен
DIN 50431:1980-09
Отменен
DIN 50431:1980-09
Отменен
DIN 50431:1988-05
Отменен