DIN 41850-4:1976-01

Отменен

Integrated film circuits; material, methods for judgement of thick film resistor compositions — 3 стр.

Ссылочные документы

Отменен

Integrated thick- and thin-film circuits; general, properties — 7 стр.

Отменен

Integrated film circuits; ceramic substrates for thickfilm integrated circuits — 2 стр.

Отменен

Method of measurement of current noise generated in fixed resistors — 5 стр.

Отменен

Film and hybrid integrated circuits; materials, methods for the assessment of conductive pastes — 6 стр.

Отменен

Integrated film circuits; methods for the assessment of dielectric pastes — 6 стр.