Electrical engineering; basis environmental testing procedures; test Fc and guidance: vibration (sinusoidal); identical with IEC 60068-2-6:1982 (status as of 1985)
Electrical engineering; basic environmental testing procedures; test Ga and guidance: acceleration, staedy state; identical with IEC 60068-2-7:1983 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test N: change of temperature; identical with IEC 60068-2-14, edition 1984 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test U: robustness of terminations and integral mounting devices; identical with IEC 60068-2-21, edition 1983
Electrical engineering; basic environmental testing procedures; test Db and guidance: damp heat, cyclic (12 + 12-hour cycle); identical with IEC 60068-2-30, edition 1980 (status as of 1985)
Quartz crystal units for frequency control and selection; part 3: standard outlines and lead connections; identical with IEC 60122-3:1977 (status as of 1991)
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a <pi>-network; identical with IEC 60444-1:1986
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 3: basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a <pi>-network with compensation of the parallel capacitance C<(Index)0>; identical with IEC 60444-3:1986
Measurement of quartz crystal unit parameters by zero phase technique in a <pi>-network; part 4: method for the measurement of load resonance frequency f<(Index)L>, load resonance resistance R<(Index)L> and the calculation of other derived values of quartz crystal units, up to 30 MHz; identical with IEC 60444-4:1988
