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DIN EN 15991:2011-04

Отменен
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011 — 28 стр.
ICS
81.060.10 Raw materials / Сырье