Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads (IEC 60068-2-20:2008); German version EN 60068-2-20:2008, Corrigendum to DIN EN 60068-2-20:2009-02— 2 стр.
Electrical engineering; basic environmental testing procedures; tests; test N: change of temperature; identical with IEC 60068-2-14, edition 1984 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test U: robustness of terminations and integral mounting devices; identical with IEC 60068-2-21, edition 1983
Electrical engineering; basic environmental testing procedures; test Db and guidance: damp heat, cyclic (12 + 12-hour cycle); identical with IEC 60068-2-30, edition 1980 (status as of 1985)
Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection (ISO 2859-1:1999 including Technical Corrigendum 1:2001), Corrigenda to DIN ISO 2859-1:2004-01— 4 стр.
Harmonized system of quality assessment for electronic components; generic specification; semiconductor optoelectronic and liquid crystal devices— 46 стр.
Harmonized system of quality assessment for electronic components; generic specification; semiconductor optoelectronic and liquid crystal devices— 46 стр.
Optical amplifiers - Part 5-2: Qualification specifications; Reliability qualification for optical fibre amplifiers (IEC 61291-5-2:2002); German version EN 61291-5-2:2002— 25 стр.
