Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016— 45 стр.
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters - AMENDMENT 2: Parameters Xsm and Xc (ISO 4287:1997/DAM 2:2013); German version EN ISO 4287:1997/prA2:2013
Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection (ISO 2859-1:1999 + Cor. 1:2001 + Amd.1:2011); Text in German and English— 195 стр.
Surface acoustic wave (SAW) resonators; part 1: general information, standard values and test conditions; section 2: test conditions; identical with IEC 61019-1-2:1993
Surface acoustic wave (SAW) filters; part 1: general information, standard values and test conditions; chapter I: general information and standard values; chapter II: test conditions; identical with IEC 60862-1:1989
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013— 43 стр.
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013— 43 стр.
