Basic environmental testing procedures - Part 2: Tests; test Ga and guidance: Acceleration, steady state (IEC 60068-2-7:1983 + A1:1986); German version EN 60068-2-7:1993— 8 стр.
Environmental testing - Part 2-21: Tests; test U: Robustness of terminations and integral mounting devices (IEC 60068-2-21:1999); German version EN 60068-2-21:1999— 19 стр.
Basic environmental testing procedures; part 2: tests; test XA and guidance: immersion in cleaning solvents (IEC 60068-2-45:1980 + A1:1993); German version EN 60068-2-45:1992 + A1:1993— 7 стр.
Environmental testing - Part 2-47: Test methods - Mounting of components, equipment and other articles for vibration, impact and similar dynamic tests (IEC 60068-2-47:1999); German version EN 60068-2-47:1999 + Corrigendum 2000— 16 стр.
Environmental testing - Part 2: Tests; guidance on the application of the tests of IEC 60068 to simulate the effects of storage (IEC 60068-2-48:1982); German version EN 60068-2-48:1999— 6 стр.
Environmental testing - Part 2: Tests; test Fc: Vibration (sinusoidal) (IEC 60068-2-6:1995 + Corrigendum 1995); German version EN 60068-2-6:1995— 26 стр.
Electrical engineering; basis environmental testing procedures; test Fc and guidance: vibration (sinusoidal); identical with IEC 60068-2-6:1982 (status as of 1985)
Electrical engineering; basic environmental testing procedures; test Ga and guidance: acceleration, staedy state; identical with IEC 60068-2-7:1983 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test N: change of temperature; identical with IEC 60068-2-14, edition 1984 (status as of 1986)
Electrical engineering; basic environmental testing procedures; tests; test U: robustness of terminations and integral mounting devices; identical with IEC 60068-2-21, edition 1983
Electrotechnic; basic environmental testing procedures; mounting of components, equipment and other articles for dynamic tests including shock (Ea), bump (Eb),vibration (Fc and Fd) and steady-state acceleration (Ga) and guidance; identical with IEC 60068-2-47, edition 1982
Basic environmental testing procedures; part 2: tests; guidance on the application of the tests of IEC Publication 60068 to simulate the effects of storage
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001— 74 стр.
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001— 74 стр.
