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DIN 50451-1:1987-10

Отменен
Testing of materials for semiconductor technology; determination of traces of metals in liquids; Ag, Au and Cu in nitric acid by means of AAS — 2 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 12691:1975-04
Отменен
Laboratory glassware; one-mark pipettes, short delivery time, waiting time 15 s, class AS — 4 стр.
DIN 8120-1:1981-07
Отменен
Weighing machines; terms and definitions — 10 стр.
DIN 12650-2:1981-10
Отменен
Mechanical, physical and electrical laboratory apparatus - Piston operated volumetric apparatus - Piston pipettes — 2 стр.
DIN 12664-1:1983-08
Отменен
Laboratory glassware; one-mark volumetric flasks; volumetric flasks with flanged edge, conical socket and conical joint — 4 стр.
DIN 51401-1:1983-12
Отменен
Atomic absorption spectrometry; terms — 14 стр.
DIN 51401-2:1987-01
Отменен
Atomic absorption spectrometry; structure of atomic absorption spectrometers — 4 стр.
DIN 50451-1:2003-04
Действует
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS — 8 стр.

На этот документ ссылаются

DIN 50451-1:2003-04
Действует
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS — 8 стр.
DIN 50456-3:1999-08
Отменен
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities — 2 стр.