Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test— 2 стр.
German standard methods for examination of water, waste water and sludge; physical and physico-chemical characteristics (group C); determination of pH value (C5)— 7 стр.
German standard methods for the examination of water, waste water and sludge; anions (group D); determination of fluoride, chloride, nitrite, (ortho)phosphate, bromide, nitrate and sulfate anions in water with a low pollution level by ion exchange chromatography (D 19)— 16 стр.
Determination of cobalt, chromium, copper, iron and nickel as impurities in hydrofluoric acid for use in semiconductor technology by plasma-induced emission spectrometry— 2 стр.
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities— 2 стр.
