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IEC 60147-2E:1973 ed1.0

Заменен
Supplement E - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods — 33 стр.
IEC 60147-2E:1973 ed1.0
Заменен
IEC 60747-2:1983 ed1.0
Заменен
IEC 60747-2:2000 ed2.0
Заменен
IEC 60747-2:2016 ed3.0
Действует