Каталог стандартов

+7 (495) 223-46-76 +7 (812) 309-78-59
inform@normdocs.ru

IEC 60749-10:2002 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock — 7 стр.
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock — 0 стр.