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IEC 60749-17:2003 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation — 11 стр.
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом