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IEC 60749-23:2004 ed1.0

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life — 17 стр.
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом