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IEC 60749-29:2003 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test — 41 стр.
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом