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IEC 60749-30:2005/AMD1:2011 ed1.0

Заменен
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing — 9 стр.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом