IEC 60749-8:2002/COR2:2003 ed1.0

Действует

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing — 0 стр.

Modification of the validity date: now put at 2007.

ICS

31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом