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IEC 60749:1984 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods. — 59 стр.
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом