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IEC 60759:1983 ed1.0

Действует
Standard test procedures for semiconductor X-ray energy spectrometers — 97 стр.
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
ICS
17.240 Radiation. Including dosimetry / Измерения параметров излучений