Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016— 45 стр.
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013— 43 стр.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017— 66 стр.
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures— 90 стр.
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures— 104 стр.
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2011); German version EN 62604-2:2012— 22 стр.
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 62604-2:2011) (english version)
