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СтандартыIEC

IEC 62047-7:2011 ed1.0

Действует
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection — 56 стр.
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На этот документ ссылаются

BS EN 62761:2014
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Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) — 24 стр.
BS EN 62604-1:2015
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Generic specification — 38 стр.
BS IEC 62830-3:2017
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Semiconductor devices. Semiconductor devices for energy harvesting and generation. Vibration based electromagnetic energy harvesting — 22 стр.
18/30366383 DC
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BS EN 62830-3:2017
Действует
Semiconductor devices. Semiconductor devices for energy harvesting and generation. Vibration based electromagnetic energy harvesting — 22 стр.
BS EN IEC 62604-2:2018
Действует
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Guidelines for the use — 30 стр.
BS EN 62604-2:2012
Заменен
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality. Guidelines for the use — 28 стр.
BS EN 62575-2:2012
Действует
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality. Guidelines for the use — 26 стр.
BS EN IEC 62969-3:2018
Действует
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