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IEC PAS 62173:2000 ed1.0

Заменен
Solderability test method — 17 стр.
Provides a means of determining the solderability of device package terminations that are intended to be joined to another surface using solder for the attachment. Provides also optional conditions for ageing and soldering for the purpose of allowing simulation of the soldering process to be used in the device application.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом