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IEC PAS 62175:2000 ed1.0

Заменен
Marking permanency test method — 5 стр.
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом