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IEC PAS 62186:2000 ed1.0

Заменен
Mechanical shock test method — 3 стр.
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. It is normally applicable to cavity-type packages.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом