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IEC PAS 62336:2002 ed1.0

Заменен
Accelerated Moisture Resistance - Unbiased HAST — 8 стр.
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом