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IEC PAS 62483:2006 ed1.0

Заменен
Test method for measuring whisker growth on tin and tin alloy surface finishes — 27 стр.
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом