ISO 16700:2004

Заменен

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification — 24 стр.

На этот документ ссылаются

DIN ISO 22309:2015-11

Действует

Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011) — 29 стр.

DIN ISO 13067:2015-07

Отменен

Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011); Text in German and English — 27 стр.

DIN ISO 22309:2015-05

Отменен

Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above (ISO 22309:2011); Text in German and English — 29 стр.

DD ISO/TS 10798:2011

Действует

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis — 38 стр.

PD IEC/TS 62622:2012

Действует

Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings — 44 стр.

ISO 16700:2016

Действует

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification — 26 стр.