Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy— 26 стр.
Surface chemical analysis -- Chemical methods for the collection of elements from the surface of siliconwafer working reference materials and their determination by total-reflection Xray fluorescence (TXRF) spectroscopy -- Amendment 1 Analyse chimique— 8 стр.
