The present document contains the test specification for Digital Enhanced Cordless Telecommunications (DECT)
Generic Access Profile (GAP) Fixed Part (FP) applications.
The main objective of the GAP test specification is to provide approval tests giving a high probability of air interface
inter-operability between different manufacturer s equipment in different environments (i.e. public, business and
residential).
The ISO standard for the methodology of conformance testing ISO/IEC 9646 parts 1 to 7 [9] to [15] is used as the basis
for the test methodology, and as the basis for the test case specification. This is considered to be unsuitable for Physical
layer testing, and therefore a text description is used.
The test cases listed in the present document have been derived from the DECT Common Interface (CI) Test Case
Library (TCL) [18] to [26]. In addition as far as the Physical layer is concerned EN 300 176 parts 1 [16] and 2 [30]
apply. Additional GAP specific test cases are included where required. The Profile IXIT is based on the DECT CI
PIXITs specified in EN 300 497 [18] to [26].